Backscattered electron SEM imaging of cells and determination of the information depth.
Identifieur interne : 000239 ( Main/Exploration ); précédent : 000238; suivant : 000240Backscattered electron SEM imaging of cells and determination of the information depth.
Auteurs : RBID : pubmed:24650037Abstract
Backscattered electron imaging of HT29 colon carcinoma cells in a scanning electron microscope was studied. Thin cell sections were placed on indium-tin-oxide-coated glass slides, which is a promising substrate material for correlative light and electron microscopy. The ultrastructure of HT29 colon carcinoma cells was imaged without poststaining by exploiting the high chemical sensitivity of backscattered electrons. Optimum primary electron energies for backscattered electron imaging were determined which depend on the section thickness. Charging effects in the vicinity of the SiO₂ nanoparticles contained in cell sections could be clarified by placing cell sections on different substrates. Moreover, a method is presented for information depth determination of backscattered electrons which is based on the imaging of subsurface nanoparticles embedded by the cells.
DOI: 10.1111/jmi.12120
PubMed: 24650037
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en">Backscattered electron SEM imaging of cells and determination of the information depth.</title><author><name sortKey="Seiter, J" uniqKey="Seiter J">J Seiter</name><affiliation wicri:level="3"><nlm:affiliation>Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.</nlm:affiliation><country xml:lang="fr">Allemagne</country><wicri:regionArea>Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), Karlsruhe</wicri:regionArea><placeName><region type="land" nuts="1">Bade-Wurtemberg</region><region type="district" nuts="2">District de Karlsruhe</region><settlement type="city">Karlsruhe</settlement></placeName></affiliation></author><author><name sortKey="M Ller, E" uniqKey="M Ller E">E Müller</name></author><author><name sortKey="Blank, H" uniqKey="Blank H">H Blank</name></author><author><name sortKey="Gehrke, H" uniqKey="Gehrke H">H Gehrke</name></author><author><name sortKey="Marko, D" uniqKey="Marko D">D Marko</name></author><author><name sortKey="Gerthsen, D" uniqKey="Gerthsen D">D Gerthsen</name></author></titleStmt><publicationStmt><date when="2014">2014</date><idno type="RBID">pubmed:24650037</idno><idno type="pmid">24650037</idno><idno type="doi">10.1111/jmi.12120</idno><idno type="wicri:Area/Main/Corpus">000108</idno><idno type="wicri:Area/Main/Curation">000108</idno><idno type="wicri:Area/Main/Exploration">000239</idno></publicationStmt></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Backscattered electron imaging of HT29 colon carcinoma cells in a scanning electron microscope was studied. Thin cell sections were placed on indium-tin-oxide-coated glass slides, which is a promising substrate material for correlative light and electron microscopy. The ultrastructure of HT29 colon carcinoma cells was imaged without poststaining by exploiting the high chemical sensitivity of backscattered electrons. Optimum primary electron energies for backscattered electron imaging were determined which depend on the section thickness. Charging effects in the vicinity of the SiO₂ nanoparticles contained in cell sections could be clarified by placing cell sections on different substrates. Moreover, a method is presented for information depth determination of backscattered electrons which is based on the imaging of subsurface nanoparticles embedded by the cells.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="In-Process"><PMID Version="1">24650037</PMID><DateCreated><Year>2014</Year><Month>04</Month><Day>10</Day></DateCreated><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Electronic">1365-2818</ISSN><JournalIssue CitedMedium="Internet"><Volume>254</Volume><Issue>2</Issue><PubDate><Year>2014</Year><Month>May</Month></PubDate></JournalIssue><Title>Journal of microscopy</Title><ISOAbbreviation>J Microsc</ISOAbbreviation></Journal><ArticleTitle>Backscattered electron SEM imaging of cells and determination of the information depth.</ArticleTitle><Pagination><MedlinePgn>75-83</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1111/jmi.12120</ELocationID><Abstract><AbstractText>Backscattered electron imaging of HT29 colon carcinoma cells in a scanning electron microscope was studied. Thin cell sections were placed on indium-tin-oxide-coated glass slides, which is a promising substrate material for correlative light and electron microscopy. The ultrastructure of HT29 colon carcinoma cells was imaged without poststaining by exploiting the high chemical sensitivity of backscattered electrons. Optimum primary electron energies for backscattered electron imaging were determined which depend on the section thickness. Charging effects in the vicinity of the SiO₂ nanoparticles contained in cell sections could be clarified by placing cell sections on different substrates. Moreover, a method is presented for information depth determination of backscattered electrons which is based on the imaging of subsurface nanoparticles embedded by the cells.</AbstractText><CopyrightInformation>© 2014 The Authors Journal of Microscopy © 2014 Royal Microscopical Society.</CopyrightInformation></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Seiter</LastName><ForeName>J</ForeName><Initials>J</Initials><Affiliation>Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.</Affiliation></Author><Author ValidYN="Y"><LastName>Müller</LastName><ForeName>E</ForeName><Initials>E</Initials></Author><Author ValidYN="Y"><LastName>Blank</LastName><ForeName>H</ForeName><Initials>H</Initials></Author><Author ValidYN="Y"><LastName>Gehrke</LastName><ForeName>H</ForeName><Initials>H</Initials></Author><Author ValidYN="Y"><LastName>Marko</LastName><ForeName>D</ForeName><Initials>D</Initials></Author><Author ValidYN="Y"><LastName>Gerthsen</LastName><ForeName>D</ForeName><Initials>D</Initials></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType>Journal Article</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2014</Year><Month>03</Month><Day>20</Day></ArticleDate></Article><MedlineJournalInfo><Country>England</Country><MedlineTA>J Microsc</MedlineTA><NlmUniqueID>0204522</NlmUniqueID><ISSNLinking>0022-2720</ISSNLinking></MedlineJournalInfo><CitationSubset>IM</CitationSubset><KeywordList Owner="NOTNLM"><Keyword MajorTopicYN="N">Backscattered electron imaging</Keyword><Keyword MajorTopicYN="N">HT29 cells</Keyword><Keyword MajorTopicYN="N">charging effects</Keyword><Keyword MajorTopicYN="N">indium-tin-oxide-coated glass</Keyword><Keyword MajorTopicYN="N">information depth</Keyword><Keyword MajorTopicYN="N">low electron energy</Keyword><Keyword MajorTopicYN="N">scanning electron microscopy</Keyword></KeywordList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="received"><Year>2013</Year><Month>7</Month><Day>4</Day></PubMedPubDate><PubMedPubDate PubStatus="accepted"><Year>2014</Year><Month>2</Month><Day>11</Day></PubMedPubDate><PubMedPubDate PubStatus="aheadofprint"><Year>2014</Year><Month>3</Month><Day>20</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2014</Year><Month>3</Month><Day>22</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2014</Year><Month>3</Month><Day>22</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2014</Year><Month>3</Month><Day>22</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pubmed">24650037</ArticleId><ArticleId IdType="doi">10.1111/jmi.12120</ArticleId></ArticleIdList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
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